MIS® C1/3V® compatible Scan abutments
Scan abutments that are compatible with MIS® C1/3V® implants.
Our scan abutments are manufactured from grade V titanium alloy (Ti-6Al-4V) which offers a combination of high fatigue strength and an unsurpassed level of bio-compatibility, with the upper part made from PEEK allowing reading and location of the implant position.
It has a precision of +/- 0.005 microns and always allows the use of autoclave for cleaning and disinfection purposes.
All of our products are CE marked and hold Quality ISO 13485 and ISO 9001 certifications.
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